Laboratorní TXRF a EDXRF spektrometr TX 2000
Pro více informací, prosím, kontaktujte prodejce:
- Zbyněk Ondra, BA (Hons)
- +420 736 473 797
- zbynek.ondra@labtech.eu
Technická specifikace
TX 2000
TX 2000 je nejmodernější laboratorní spektrometr pro kvantitativní multi-prvkovou stopovou analýzu s využitím principů úplného odrazu RTG fluorescence (TXRF).
Metoda TXRF (Total Reflection X-Ray Fluorescence) funguje na základě stejných principů tradiční rentgenové fluorescence (XRF), avšak minimalizuje nebo zcela eliminuje vliv matrice. Tato metoda umožňuje provádět současnou víceprvkovou stopovou analýzu a nabízí mez detekce až v PPB (parts per billion) v rozsahu od sodíku po plutonium.
Technické parametry
| X-Ray Generator | Maximum Output Power | 3 kW (option: 4 kW) |
| Output Stability | < 0.01 % (for 10% power supply fluctuation) | |
| Max Output Voltage | 60 kV | |
| Max Output Current | 60 mA (option: 80 mA) | |
| Voltage Step Width | 0.1 kV | |
| Current Step Width | 0.1 mA | |
| Ripple | 0.03% rms < 1kHz, 0.75% rms > 1kHz | |
| Preheat and Ramp | Automatic preheat and ramp control circuit | |
| Input Voltage | 220 Vac +/-10%, 50 or 60 Hz, single phase | |
| Size | Width 48.3 cm, height 13.3 cm, depth 56 cm | |
| X-Ray Tube | Type | Glass, Mo/W anode, long fine focus |
| Focus | 0.4 x 12 mm | |
| Max Output | 2.5 kW | |
| Multilayer monochromator | Type | Si/W |
| Reflectivity | 80% | |
| Automatic Sample | Sample seating | 12 for TXRF - 1 for EDXRF (45°) |
| Detector | Type | Peltier-cooled Silicon Drift Detector (SDD) |
| Active Area | 30 mm2 (10, 50 and 100 as options) | |
| Energy Resolution | Shaping Time 1 ms | |
| Preamplifer | Type | Pulsed-reset charge-preamplifer |
| Case | Dimensions | Width 550 mm, Heigh 1675 mm, Depth 805 mm |
| Leakage X-Rays | < 1 mSv/Year (full safety shielding according to the international guidelines) | |
| Processing Unit | Computer Type | Personal Computer |
| Items Controlled | X-Ray Generator, Tube Shield, Monochromator, Detector, Counting Chain | |
| Basic Data Processing | Multisample positioning | |
| Counter Chain parameter settings | ||
| Selection of Radiation | ||
| Centring procedure | ||
| K. L & M markers | ||
| Time or count selection | ||
| Acquisition of data in both geometries (TXRF - EDXRF) | ||
| Least Square Marquardt fit procedure for the area calculation | ||
| Automatic / Manual search Function | ||
| Automatic / Manual Calibration of Energy | ||
| Quantification via an internal standard using theoretical and experimental sensitivity curves for total reflection |
Dotaz
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